Menu

Wafer AVI

       

Foreign Object

 

Discoloration

 

Scratch

 

Breakage

 

Chipping

Wafer AVI system is designed to perform automatic final inspecting system. It integrates professional vision and optics technology. Besides, reliable mechanical system reduces the maintenance time. It is especially suitable for the demand for high quality and low cost inspection.
Patent full angle LED lighting can obtain the best defect images and can be applied to the inspection for different problems. Unique inspection techniques adapt to wafer image processing. It can detect chipping, bump / pad scratch, discoloration, missing, shift, abnormal feature size and foreign object, etc. This system can work with recheck station to enhance the throughput.

 

Step by step user interface reduces training time and accelerates the implement of production.

Create new recipe in 30 minutes.

Production and off-line review can work in the same time.

Comprehensive software and hardware service support can be provided.

 

Stable and long-life LED lighting can reduce repair time and cost.

Intuitional parameter UI to decrease setup time and recheck time.

Quick 8” and 12” setup, no any tools required to adjust or change.

PCB Inspection Series

 
Wiring Inspection Series
 
  Circuit AOI 4.0
Circuit AOI
ArtWork AOI
LineGauge
   
 
IC Substrate, HDI & FPCB Inspection + Measuring Series
 
  3D AOI
Solid Measuring Viewer
LaserVia AOIM
   
 
AFI Series
 
  AFI
FPCB AVI
CSP AFI
   
 
Drilling & Routing Measuring Series
 
  Hole AOI/Express
EZ3D

COF Inspection Series

  COF AOI

Semiconductor Series